Combined Analysis
Daniel Chateigner
This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The text starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models.
Categorias:
Ano:
2010
Edição:
1
Editora:
Wiley-ISTE
Idioma:
english
Páginas:
496
ISBN 10:
1848211988
ISBN 13:
9781848211988
Série:
ISTE
Arquivo:
PDF, 10.63 MB
IPFS:
,
english, 2010
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